Description

It is necessary to ensure the faultless test generation when designing the circuits. For that we have to test our design based on linear feedback shift register method. Linear feedback shift register (LFSR) is a shift register whose input bit is a linear function of its previous state. The most commonly used linear function of single bits is exclusive-or (XOR). Thus, an LFSR is most often a shift register whose input bit is driven by the XOR of some bits of the overall shift register value. Therefore, a seed for a given LFSR may be found even if one cannot be found based on a test cube. The proposed system is to improve the BIST system performance level and to reduce the power consumption level also. The proposed system is used to increase the test pattern generation process. Our proposed work is to develop the VHDL programmable logic function and to simulate the XILINX 14.2 software.