Description

Error correction code (ECC) and built-in selfrepair (BISR) techniques by using redundancies have been widely used for improving the yield and reliability of embedded memories. The target faults of these two schemes are soft errors and permanent (hard) faults, respectively. In recent works, there are also some techniques integrating ECC and BISR to deal with soft errors and hard defects simultaneously. However, this will compromise reliability, since some of the ECC protection capability is used for repairing single hard faults.