Description

A built-in self-test (BIST) or built-in test (BIT) is a mechanism that permits a machine to test itself. Engineers design BISTs to meet requirements. BIST (Build-in Self-Test), schemes are the solution of testing VLSI devices. BIST is used to make faster, less-expensive integrated circuit manufacturing tests. The IC has a function that verifies all or a portion of the internal functionality of the IC. In some cases, this is valuable to customers, as well. For example, a BIST mechanism is provided in advanced field bus systems to verify functionality. They perform during testing of circuits based on CTL. A cyclic redundancy check is an error-detecting code commonly used in digital Tag: VLSI-Verilog-VHDL-Xillinx-CMOS-TannerTool-FPGA