Product | Details | Total |
---|---|---|
![]() | Built-In Self-Test Methodology With Statistical Analysis for Electrical Diagnosis of Wearout in a Static Random Access Memory Array Rs4,500.00 Present an electrical diagnosis methodology for a variety of wearout mechanisms, including back-end time-dependent… | Rs4,500.00 |
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SubtotalRs4,500.00
9% CGSTRs405.00
9% SGSTRs405.00
Total
Rs5,310.00