Product | Details | Total |
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![]() | Input Vector Monitoring Concurrent BIST Architecture Using SRAM Cells Rs3,000.00 BIST (Build-in Self Test), schemes are the solution of testing VLSI devices. BIST is used… | Rs3,000.00 |
![]() | Unified-VLSI-architecture-for-photo-core-transform-used-in-JPEG-XR Rs4,500.00 Unified VLSI architecture for photo core transform used in JPEG XR’, the authors proposed… | Rs4,500.00 |
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