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Computing Seeds for LFSR-Based Test Generation From Nontest Cubes

Computing Seeds for LFSR-Based Test Generation From Nontest Cubes

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 Computing Seeds for LFSR-Based Test Generation From Nontest Cubes

 In test data compression methods that are based on the use of a linear-feedback shift register (LFSR), a seed that produces a test for a target fault is computed based on a test cube for the fault. With a given LFSR, a seed may not exist for a given test cube, even though a seed may exist for a different test cube that detects the same fault. This issue is addressed in this brief by computing seeds for LFSR-based test generation without using test cubes. Instead, the procedure described in this brief is based on the use of nontest cubes. A nontest cube for a fault must be avoided in any test or test cube for the fault in order to allow the fault to be detected.


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  • Model: PROJ7022
  • 999 Units in Stock
  • Manufactured by: ClickMyProjects

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This product was added to our catalog on Monday 29 May, 2017.